Multi-frequency ESR analysis of the E′δ defect hyperfine structure in SiO2 glasses

Author: Stesmans A.   Jivanescu M.   Afanas'ev V. V.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|93|1|16002-16002

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.93, Iss.1, 2011-02, pp. : 16002-16002

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Abstract