Effect of ultrasonic treatment on the defect structure of the Si-SiO 2 system

Author： Kropman D.   Poll V.   Tambek L.   Karner T.   Abru U.  

Publisher： Elsevier

ISSN： 0041-624X

Source： Ultrasonics, Vol.36, Iss.10, 1998-10, pp. : 1021-1025

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