Author： Kityk A. V. Muševič I. Slak G. Fuith A. Blinc R.
Publisher： Edp Sciences
E-ISSN： 1286-4854|36|5|373-378
ISSN： 0295-5075
Source： EPL (EUROPHYSICS LETTERS), Vol.36, Iss.5, 2010-03, pp. : 373-378
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Photon scanning tunneling microscope with a nonresonance atomic-force regime
By Lapshin D.
Technical Physics, Vol. 43, Iss. 9, 1998-09 ,pp. :
Access to resources
Recommend
By Zheng Yelong Song Le Hu Gang Cai Xue Liu Hongguang Zhao Meirong Fang Fengzhou Zheng Yelong
Measurement Science and Technology, Vol. 26, Iss. 5, 2015-05 ,pp. :
Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope
By Shih Po-Jen
Sensors, Vol. 12, Iss. 5, 2012-05 ,pp. :
Access to resources