Defect-mediated kinetic roughening in low-temperature MBE growth of Si/Si (111)

Author： Gallas B.   Berbezier I.   Derrien J.   Gandolfo D.   Ruiz J.   Zagrebnov V. A.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|41|5|519-524

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.41, Iss.5, 2010-03, pp. : 519-524

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