New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|2|247-254

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.2, 2017-03, pp. : 247-254

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