Atom Probe Tomography Microscopy APTM 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|2|187-193

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.2, 2017-04, pp. : 187-193

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