Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out

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Microscopy and Microanalysis, Vol. 22, Iss. 6, 2016-11 ,pp. : 1338-1349

Cambridge University Press

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Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2016-10 ,pp. : 321-328

Cambridge University Press

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A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation

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Microscopy and Microanalysis, Vol. 23, Iss. 4, 2017-06 ,pp. : 782-793

Cambridge University Press

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Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments

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Microscopy and Microanalysis, Vol. 23, Iss. 4, 2017-06 ,pp. : 708-716

Cambridge University Press

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Reflections on the Projection of Ions in Atom Probe Tomography

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 238-246

Cambridge University Press

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