Diffraction gratings metrology and ray‐tracing results for an XUV Raman spectrometer at FLASH

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|25|1|138-144

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.25, Iss.1, 2018-01, pp. : 138-144

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