An efficient and reliable small signal intrinsic parameters extraction for HEMT GaN devices

Publisher: John Wiley & Sons Inc

E-ISSN: 1098-2760|60|2|455-458

ISSN: 0895-2477

Source: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, Vol.60, Iss.2, 2018-02, pp. : 455-458

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Abstract