Dynamic diffraction artefacts in Bragg coherent diffractive imaging

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|51|1|167-174

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.51, Iss.1, 2018-02, pp. : 167-174

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of defects in mono‐like silicon for photovoltaic applications using X‐ray Bragg diffraction imaging

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 645-654

John Wiley & Sons Inc

Access to resources Recommend Favorite

Powder diffraction in Bragg–Brentano geometry with straight linear detectors

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 2, 2015-04 ,pp. : 613-618

John Wiley & Sons Inc

Access to resources Recommend Favorite

Removing multiple outliers and single‐crystal artefacts from X‐ray diffraction computed tomography data

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 6, 2015-12 ,pp. : 1943-1955

John Wiley & Sons Inc

Access to resources Recommend Favorite

XTOP: high‐resolution X‐ray diffraction and imaging

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 620-620

John Wiley & Sons Inc

Access to resources Recommend Favorite

Inception and movement of a `subgrain boundary precursor' in ice under an applied stress, observed by X‐ray synchrotron radiation Bragg imaging

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 672-678

John Wiley & Sons Inc

Access to resources Recommend Favorite