Control of interface between HfO2 and air‐exposed InGaAs by ultrathin Si interface control layer

Publisher: John Wiley & Sons Inc

E-ISSN: 1610-1642|7|2|351-354

ISSN: 1862-6351

Source: PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.7, Iss.2, 2010-02, pp. : 351-354

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Abstract