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Preparation and characterization of Bi 2 S 3 -PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

By Acharya B.S.   Nayak B.B.   Parhi N.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 47-53

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SnO 2 thin films prepared by ion beam induced CVD: preparation and characterization by X-ray absorption spectroscopy

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Preparation and characterization of Bi 2 Ti 2 O 7 thin films by chemical solution deposition technique

By Wu X.   Wang S.W.   Wang H.   Wang Z.   Shang S.X.   Wang M.  

Thin Solid Films, Vol. 370, Iss. 1, 2000-07 ,pp. : 30-32

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Preparation and characterization of C 60 S 16 and C 70 S 48 thin films

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