Crack tip dislocations in silicon characterized by highvoltage electron microscopy

Author: K. Higashida   N. Narita   M. Tanaka   T. Morikawa   Y. Miura   R. Onodera  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.17-18, 2002-11, pp. : 3263-3273

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