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Elsevier

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Taylor & Francis Ltd

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Imperfect dislocations at non-basal plane defects in 18R and 2H martensites: transmission electron microscopy studies

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In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures

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X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

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