Related content

Studying electrical transport in carbon nanotubes by conductance atomic force microscopy

By Gómez-Navarro C.   Pablo P.   Gómez-Herrero J.  

Journal of Materials Science: Materials in Electronics, Vol. 17, Iss. 6, 2006-06 ,pp. : 475-482

Springer Publishing Company

Access to resources Recommend Favorite

Measurements of mechanical properties in Ni-base superalloys using nanoindentation and atomic force microscopy

By Schoberl T.   Gupta H.S.   Fratzl P.  

Materials Science and Engineering: A, Vol. 363, Iss. 1, 2003-12 ,pp. : 211-220

Elsevier

Access to resources Recommend Favorite

Atomic force microscopy study of silica nanopowder compacts

By Harrington S.   Zhu D-M.   Thirunavukkarasu A.   Misra A.  

Journal of Materials Science, Vol. 34, Iss. 9, 1999-05 ,pp. : 2075-2079

Springer Publishing Company

Access to resources Recommend Favorite

Atomic force microscopy using plastic replicas

By Campbell J.B.   Lankford J.  

Journal of Materials Science, Vol. 35, Iss. 3, 2000-02 ,pp. : 757-765

Springer Publishing Company

Access to resources Recommend Favorite

Optical and electrical properties of carbon nitride films deposited by cathode electrodeposition

By Zhang J-T.   Cao C-B.   Lv Q.   Li C.   Zhu H-S.  

Journal of Materials Science, Vol. 38, Iss. 12, 2003-06 ,pp. : 2559-2562

Springer Publishing Company

Access to resources Recommend Favorite