Electromigration activation energy in pure aluminum films deposited by partially ionized beam technique

Author： Kononenko O.V.   Ivanov E.D.   Matveev V.N.   Khodos I.I.  

Publisher： Elsevier

ISSN： 0956-716X

Source： Scripta Metallurgica et Materiala, Vol.33, Iss.12, 1995-12, pp. : 1981-1986

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