Simultaneous measurement of refractive index and thickness of transparent material by dual-beam confocal microscopy

Author: Kuo Wen-Chuan   Bou Yu-Ki   Lai Chih-Ming  

Publisher: IOP Publishing

ISSN: 0957-0233

Source: Measurement Science and Technology, Vol.24, Iss.7, 2013-07, pp. : 75003-75007

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Abstract