Author: Hashimoto Y. Yorozu S. Numata H. Koike M. Tanaka M. Tahara S.
Publisher: Elsevier
ISSN: 0964-1807
Source: Applied Superconductivity, Vol.6, Iss.10, 1999-10, pp. : 823-828
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
By Pedersen U.P.I. O.Aaserud** Bungum*** O.W.
Microelectronics International, Vol. 13, Iss. 1, 1996-01 ,pp. :
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
By Nourani M.
Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. :