Author: Nummer M.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.19, Iss.3, 2003-06, pp. : 299-314
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Pedersen U.P.I. O.Aaserud** Bungum*** O.W.
Microelectronics International, Vol. 13, Iss. 1, 1996-01 ,pp. :
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
By Nourani M.
Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. :