Author: Sobolev M. Gadzhiev I. Bakshaev I. Nevedomskii V. Buyalo M. Zadiranov Yu. Portnoi E.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7826
Source: Semiconductors, Vol.45, Iss.8, 2011-08, pp. : 1064-1069
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Abstract