Tin contamination in PQFN package and its effects on wire bondability

Author: Zong Fei   Wang Zhi-jie   Xu Yan-bo   Niu Ji-yong   Zhang Han-min  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.30, Iss.3, 2013-07, pp. : 176-186

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Abstract