Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

Author: Choi W.J.   Lee T.Y.   Tu K.N.   Tamura N.   Celestre R.S.   MacDowell A.A.   Bong Y.Y.   Nguyen L.  

Publisher: Elsevier

ISSN: 1359-6454

Source: Acta Materialia, Vol.51, Iss.20, 2003-12, pp. : 6253-6261

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract