Electrical Stress Effect on On-Current of MILC Poly-Si Thin-Film Transistors

Author: Byun Chang Woo   Son Se Wan   Lee Yong Woo   Joo Seung Ki  

Publisher: American Scientific Publishers

ISSN: 1533-4899

Source: Journal of Nanoscience and Nanotechnology, Vol.13, Iss.10, 2013-10, pp. : 7046-7049

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