Fabrication and RF Characterization of a Single Nickel Silicide Nanowire for an Interconnect

Author: Lee Dongjin   Kang Myunggil   Hong Suheon   Hwang Donghoon   Heo Keun   Joo Won-Jae   Kim Sangsig   Whang Dongmok   Hwang Sung Woo  

Publisher: American Scientific Publishers

ISSN: 1533-4899

Source: Journal of Nanoscience and Nanotechnology, Vol.13, Iss.9, 2013-09, pp. : 6222-6225

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content