Author: Lin Zone-Ching Chou Ming-Ho
Publisher: American Scientific Publishers
ISSN: 1546-1963
Source: Journal of Computational and Theoretical Nanoscience, Vol.10, Iss.11, 2013-11, pp. : 2676-2693
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Rieu J.P. Ronzon F. Roux B.
Thin Solid Films, Vol. 406, Iss. 1, 2002-03 ,pp. :
Quantitative wear analysis using atomic force microscopy
Wear, Vol. 222, Iss. 2, 1998-11 ,pp. :
Contact and non-contact mode imaging by atomic force microscopy
By Morita S. Fujisawa S. Kishi E. Ohta M. Ueyama H. Sugawara Y.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :
Nanomechanical measurements on polymers using contact mode atomic force microscopy
Thin Solid Films, Vol. 339, Iss. 1, 1999-02 ,pp. :
Local elasticity measurement on polymers using atomic force microscopy
By Nie H.-Y. Mizutani W. Tokumoto H. Motomatsu M.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :