Twin-scale Vernier Micro-pattern for Visual Measurement of 1-D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio

Author： Zea July Galeano  

Publisher： Taylor & Francis Ltd

ISSN： 1559-9612

Source： International Journal of Optomechatronics, Vol.7, Iss.3, 2013-07, pp. : 222-234

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