The supply voltage scaled dependency of the recovery of single event upset in advanced complementary metal-oxide-semiconductor static random-access memory cells

Author： Da-Wei Li   Jun-Rui Qin   Shu-Ming Chen  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.22, Iss.2, 2013-02, pp. : 29402-29405

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