Extraction of Channel Length Independent Series Resistance for Deeply Scaled Metal-Oxide-Semiconductor Field-Effect Transistors

Author: Li-Juan Ma   Xiao-Li Ji   Yuan-Cong Chen   Hao-Guang Xia   Chen-Xin Zhu   Qiang Guo   Feng Yan  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.31, Iss.9, 2014-09, pp. : 97302-97304

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