Failure probability estimation with differently sized reference products for semiconductor burn‐in studies

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APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY, Vol. 31, Iss. 5, 2015-09 ,pp. : 732-744

John Wiley & Sons Inc

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Failure probability estimation with differently sized reference products for semiconductor burn‐in studies

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APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY, Vol. 1524-1904, Iss. 5, 2015-09 ,pp. : 732-744

John Wiley & Sons Inc

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