Author: Wu X. Weatherly G. C.
Publisher: Taylor & Francis Ltd
ISSN: 1362-3036
Source: Philosophical Magazine Letters, Vol.80, Iss.8, 2000-07, pp. : 535-541
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Epitaxial Growth of Strained Ge Films on GaAs(001)
By Salazar-Hernandez B. Vidal M.A. Navarro-Contreras H. Vazquez-Lopez C.
Thin Solid Films, Vol. 352, Iss. 1, 1999-09 ,pp. :
Ellipsometric study on the surface of In 0.7 Ga 0.3 As x P 1-x thin films exposed to air
By Kim H.-R.
Thin Solid Films, Vol. 394, Iss. 1, 2001-08 ,pp. :
Characterization of GaAs buffer layer function in GaAs/InP strained structure grown by MBE
By Wang C.-Y. Chou Y.-C. Lee C.-T.
Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. :