Microstructure and shape-memory behavior of annealed Ti 51.5 Ni 33.1 Cu 15.4 thin films

Author: Ishida A.   Sato M.   Ogawa K.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.86, Iss.1, 2006-01, pp. : 13-20

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Abstract