Author： Texier M. Regula G. Lancin M. Pichaud B.
Publisher： Taylor & Francis Ltd
ISSN： 1362-3036
Source： Philosophical Magazine Letters, Vol.86, Iss.9, 2006-09, pp. : 529-537
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Three-Dimensional Imaging of Extended Defects in 4H-SiC
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :
Access to resources
Recommend
On Deep Level Transient Spectroscopy of Extended Defects in n-Type 4H-SiC
Materials Science Forum, Vol. 2017, Iss. 897, 2017-06 ,pp. :
Study of Triangle-Shaped Defects on Nearly On-Axis 4H-SiC Substrates
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :