Author: Wang J.
Publisher: Taylor & Francis Ltd
ISSN: 1478-6443
Source: Philosophical Magazine, Vol.87, Iss.1, 2007-01, pp. : 11-27
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron Transport through Thin SiO2 Films Containing Si Nanoclusters
Journal of Nano Research, Vol. 2016, Iss. 39, 2016-03 ,pp. :
Infrared characterisation of evaporated SiO thin films
Thin Solid Films, Vol. 416, Iss. 1, 2002-09 ,pp. :
Microstructure control of YMnO 3 thin films on Si (100) substrates
By Yoo D.C. Lee J.Y. Kim I.S. Kim Y.T.
Thin Solid Films, Vol. 416, Iss. 1, 2002-09 ,pp. :