Microstructure and shape memory behaviour of annealed Ti51.5Ni(48.5-x)Cux (x = 6.5-20.9) thin films

Author: Ishida A.   Sato M.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.87, Iss.35, 2007-12, pp. : 5523-5538

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract