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Taylor & Francis Ltd

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Structural study of Ni 80 Fe 20 /Cu multilayers by X-ray diffraction

By Xu M.   Chai C.   Luo G.   Yang T.   Mai Z.   Lai W.  

Thin Solid Films, Vol. 375, Iss. 1, 2000-10 ,pp. : 205-209

Elsevier

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Sizes and distances of metal clusters in Au-, Pt-, W- and Fe-containing diamond-like carbon hard coatings: a comparative study by small angle X-ray scattering, wide angle X-ray diffraction, transmission electron microscopy and scanning tunnelling microscopy

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Nano-Structural Alteration of Pyrophyllite by Grinding Revealed by X-Ray Diffraction and High-Resolution Transmission Electron Microscopy

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Trans Tech Publications

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Low-energy electron diffraction, Scanning tunneling microscopy and X-ray photoemission spectroscopy investigations of DMe-DCNQI on Cu(110)

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