Thickness and grain size dependence of the strength of copper thin films as investigated with bulge tests and nanoindentations

Author： Merle Benoit Schweitzer Elmar W. Göken Mathias

Publisher： Taylor & Francis Ltd

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.92, Iss.25-27, 2012-09, pp. : 3172-3187

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