Computer-assisted simulation of high-voltage electron microscopy using serial images recorded by conventional transmission electron microscopy

By Pascher R.   Berthold2 C-H.   Rydmark1 2- M.  

Journal of Electron Microscopy, Vol. 51, Iss. 2, 2002-04 ,pp. : 113-126

Oxford University Press

Access to resources Recommend Favorite

spectrum-imaging, electron energy-loss spectroscopy, scanning transmission electron microscopy, elemental mapping, multilayer

By Kurata H  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 141-146

Oxford University Press

Access to resources Recommend Favorite

scanning transmission electron microscope, Behte method, multislice method

By Mitsuishi K   Takeguchi M   Yasuda H   Furuya K  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 157-162

Oxford University Press

Access to resources Recommend Favorite

Microstructural characterization of Ni22Fe22Cr6Al metallic foam by transmission electron microscopy

By Kim Hyung Giun   Lee Taeg Woo   Lee Jae Young   Lee Eui Sung   Oh Kwon Oh   Lee Chang Woo   Lim Sung Hwan  

Journal of Electron Microscopy, Vol. 61, Iss. 5, 2012-10 ,pp. : 299-304

Oxford University Press

Access to resources Recommend Favorite

scanning transmission electron microscopy, Z-contrast, ADF, Bloch waves, thermal diffuse scattering, imaging theory

By Rafferty B  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 227-233

Oxford University Press

Access to resources Recommend Favorite