Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy

By Göken M.   Thome F.   Vehoff H.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 17-18, 2002-11 ,pp. : 3241-3250

Taylor & Francis Ltd

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Rutherford backscattering spectrometry, particle induced X-ray emission and atomic force microscopy of InAs thin films grown on GaAs: A complementary study

By Bouhacina T.   Aime J.P.   Barriere A.S.   Guegan H.   Grandjean N.   Massies J.  

Thin Solid Films, Vol. 278, Iss. 1, 1996-05 ,pp. : 155-165

Elsevier

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Roughness determination of plasma-modified surface layers with atomic force microscopy

By Almqvist N.   Fredriksson S.   Rubel M.   Wienhold P.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 426-430

Elsevier

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Study by atomic force microscopy of elementary deformation mechanisms involved in low load indentations in MgO crystals

By Tromas C.   Girard J. C.   Woirgard J.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 10, 2000-10 ,pp. : 2325-2335

Taylor & Francis Ltd

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Atomic force microscopy study of the growth mechanism of ultrathin YBa 2 Cu 3 O 7 (YBCO) films

By Zhao B.R.   Zheng L.Z.   Li L.   Bai C.L.   Zhu C.F.   Wang X.W.   Zhang P.C.   Li Q.   Wang C.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 70-73

Elsevier

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