RBS and XHRTEM characterization of epitaxial Ni films prepared by biased d.c. sputter deposition on MgO(001)

Author： Hashimoto M. Nakai H. Qiu H. Adamik M. Safran G. Barna P.B. Safran G.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.263, Iss.2, 1995-07, pp. : 159-161

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