AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips

Author： Kaupp G.   Schmeyers J.   Pogodda U.   Haak M.   Marquardt T.   Plagmann M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.264, Iss.2, 1995-08, pp. : 205-211

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