Scanning tunnelling microscopy on quenched Si(111) surfaces

Author: Teufel L.   Heuell P.   Kulakov M.A.   Bullemer B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.264, Iss.2, 1995-08, pp. : 236-239

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Abstract