X-ray diffraction structural analysis of Langmuir-Blodgett films using a pattern recognition approach

Author： Mariani P. Maccioni E. Rustichelli F. Delacroix H. Troitsky V. Riccio A. Gambacorta A. De Rosa M.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.265, Iss.1, 1995-09, pp. : 74-83

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