Stability of structural defects of polycrystalline silicon grown by rapid thermal annealing of amorphous silicon films

Author： Girginoudi D.   Girginoudi S.   Thanailakis A.   Georgoulas N.   Stoemenos J.   Antonopoulos J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.268, Iss.1, 1995-11, pp. : 1-4

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