Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

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Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi 2 Ta 2 O 9 thin films

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Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering

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Structural and morphological characterisation of ruthenium phthalocyanine films by energy dispersive X-ray diffraction and atomic force microscopy

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Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

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