Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

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Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. : 37-45

Elsevier

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An integrated optical method for measuring the thickness and refractive index of birefringent thin films

By Caliendo C.   Verona E.   Saggio G.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 255-259

Elsevier

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Determination of optical constants and average thickness of thin films on thick substrates using angular distribution of intensity of reflected radiation

By Jaglarz J.   Nowak M.  

Thin Solid Films, Vol. 278, Iss. 1, 1996-05 ,pp. : 124-128

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Growth of ZnO:Ga thin films at room temperature on polymeric substrates: thickness dependence

By Fortunato E.   Goncalves A.   Assuncao V.   Marques A.   Aguas H.   Pereira L.   Ferreira I.   Martins R.  

Thin Solid Films, Vol. 442, Iss. 1, 2003-10 ,pp. : 121-126

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Effect of Thickness on Mechanically Tunable Magnetic Anisotropy of FeGa Thin Films Deposited on Flexible Substrates

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Materials Science Forum, Vol. 2015, Iss. 815, 2015-05 ,pp. : 227-232

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