Author: Peterse W.J.A.M. Steinfort A.J. Scholte P.M.L.O. Tuinstra F.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.289, Iss.1, 1996-11, pp. : 49-53
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An X-ray diffraction study of epitaxial TiN/NbN superlattices
By Madan A. Yashar P. Shinn M. Barnett S.A.
Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. :
New X-ray diffraction method for materials science
By Swiatek Z. Bonarski J.T. Ciach R. Kuznicki Z.T.
Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. :
Thin Solid Films, Vol. 261, Iss. 1, 1995-06 ,pp. :
Profile analysis of thin film X-ray diffraction peaks
By Bimbault L. Badawi K.F. Goudeau P. Durand N. Branger V.
Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. :