New application of classical X-ray diffraction methods for epitaxial film characterization

Author: Peterse W.J.A.M.   Steinfort A.J.   Scholte P.M.L.O.   Tuinstra F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.289, Iss.1, 1996-11, pp. : 49-53

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract