Characterization for morphology of thin deposited Fe, Fe 2 O 3 and Cr 2 O 3 films on silicon wafer using grazing incidence X-ray scattering

Author： Kosaka T.   Suzuki S.   Saito M.   Waseda Y.   Matsubara E.   Sadamori K.   Aoyagi E.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.289, Iss.1, 1996-11, pp. : 74-78

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