PEELS and EXELFS characterization of diamond films grown by the HF-CVD technique on non-scratched Si substrates

Author: Duarte-Moller A.   Contreras O.   Hirata G.A.   Avalos-Borja M.   Galvan D.H.   Morales de la Garza L.   Cota-Araiza L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.304, Iss.1, 1997-07, pp. : 45-47

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Abstract