Raman spectroscopy and X-ray diffraction study of sol-gel derived (Pb 1-x La x )Ti 1-x/4 O 3 thin films on Si substrates

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Thin Solid Films, Vol. 322, Iss. 1, 1998-06 ,pp. : 323-328

Elsevier

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X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

By Li B.   Fujimoto T.   Fukumoto N.   Honda K.   Kojima I.  

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 140-144

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Rutherford backscattering spectrometry, particle induced X-ray emission and atomic force microscopy of InAs thin films grown on GaAs: A complementary study

By Bouhacina T.   Aime J.P.   Barriere A.S.   Guegan H.   Grandjean N.   Massies J.  

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Study of the X-ray emission from Ta plasma obtained by ns laser ablation

By Amato E.   Torrisi L.  

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An X-ray diffraction (XRD) study of vapor deposited gold thin films on aluminum nitride (AlN) substrates

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Thin Solid Films, Vol. 304, Iss. 1, 1997-07 ,pp. : 229-238

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