Electron microscopy analysis of the microstructure of Ti 1-x Al x N alloy thin films prepared using a chemical vapour deposition method

Author: Ikeda S.   Gilles S.   Chenevier B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.315, Iss.1, 1998-03, pp. : 257-262

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